출판된 논문

Published Paper

2025 – End-to-End Yield Management for Compound Semiconductors Manufacturing

Compound Semiconductors

,

제조 분석

,

Silicon Carbide

,

Yield Management

Published Paper

2025-Full Wafer Inspection for Voltage Contrast Systematic Defects Using High-Throughput Point Scan

e-Beam

,

Voltage Contrast

Published Paper

2025-Stress-related Local Layout Effects in FinFET Technology and Device Design Sensitivity

Silicon Carbide

,

Modeling

Published Paper

2025-Product Design Enhancement with Test Structures for Non-Contact Detection of Yield Detractors

Yield Management

,

e-Beam

,

Characterization

,

Design for Manufacturing

Published Paper

2025-The Overview of Silicon Carbide Technology: Status, Challenges, Key Drivers, and Product Roadmap

Silicon Carbide

,

Electric vehicles

Published Paper

2025-Full-chip Voltage Contrast Inference Using Deep Learning; You Only Look Once: Voltage Contrast (YOLO-VC)

Voltage Contrast

,

e-Beam

Published Paper

2024 – Expediting manufacturing safe launch with Big Data AI/ML analytic solutions on the cloud

Yield Management

,

Manufacturing

Published Paper

EDTM 2022 - 검사 및 모니터링을 위한 새로운 전자빔 기술

Yield Management

,

e-Beam

Published Paper

EDTM 2022 - BEOL 오버레이 및 공정 마진 특성화를 위한 새로운 방법

Voltage Contrast

,

Design for Manufacturing

Published Paper

나노츠 2021 - 다이렉트스캔을 통한 고급 고처리량 전자빔 검사

Voltage Contrast

,

Design for Manufacturing

,

프로세스 제어

Published Paper

APCSM 2020 - 머신 러닝과 고급 이상값 탐지를 결합하여 품질을 개선하고 비용을 절감하는 방법

AI/ML

,

Data

Published Paper

IEEE S3S 2019 - FDSOI 기술을 위한 특성화 과제 및 솔루션

Yield Management